Ptr

1010-A-0.8NE-AU-1.5

Standard spring contact with probe, waffle, Ø 1.5 mm, travel  3 mm, pitch 1.91 mm, L 17 mm, 1010-A-0.8NE-AU-1.5

1010-B-0.8NE-AU-0.45

Standard spring contact with probe, tip, Ø 0.45 mm, travel 3 mm, pitch 1.91 mm, L 17 mm, 1010-B-0.8NE-AU-0.45

1010-C-0.8NE-AU-1.5 C

Standard spring contact with probe, tip, Ø 1.5 mm, travel 3 mm, pitch 1.91 mm, L 17 mm, 1010-C-0.8NE-AU-1.5 C

1015-D-1.5N-AU-1.25

Standard spring contact with probe, round head, Ø 1.25 mm, travel  4.4 mm, pitch 2.54 mm, L 25.4 mm, 1015-D-1.5N-AU-1.25

1040-C-1.5N-AU-4.0

ICT spring contact with probe, waffle, Ø 4 mm, travel  5.5 mm, pitch 4 mm, L 34.5 mm, 1040-C-1.5N-AU-4.0

1040-D-1.5N-AU-2.4

ICT spring contact with probe, round head, Ø 2.4 mm, travel 5.5 mm, pitch 4 mm, L 34.5 mm, 1040-D-1.5N-AU-2.4

5082-D-3.0NE-AU-4.0 M

Battery charge and interface contact with probe, round head, Ø 4 mm, travel  4 mm, pitch 6.5 mm, L 15 mm, 5082-D-3.0NE-AU-4.0 M

5099-D-2.0N-AU-1.3 C

Battery charge and interface contact with probe, round head, Ø 1.3 mm, travel  1.2 mm, pitch 3 mm, L 5.1 mm, 5099-D-2.0N-AU-1.3 C

5110/G-D-1.2NE-AU-2.3 C

Thread test pin with probe, round head, Ø 2.3 mm, travel 3.5 mm, pitch 4 mm, L 22.5 mm, 5110/G-D-1.2NE-AU-2.3 C

H 1015 L

Sleeve for test probe, soldered connection, H 1015 L